[Errno 5] Input/output error after shred
Hi,
I ran shred on my Dell XPS hard drive in order to sell it. I tried to re-install Windows and it cannot see the drive. Then I booted from an Intrepid live CD and tried to install but I got this error
The installer encountered an error copying files to the hard disk:
[Errno 5] Input/output error
This particular error is often due to a faulty CD/DVD disk or drive, or a faulty hard disk. It may help to clean the CD/DVD, to burn the CD/DVD at a lower speed, to clean the CD/DVD drive lens (cleaning kits are often available from electronics suppliers), to check whether the hard disk is old and in need of replacement, or to move the system to a cooler environment.
Here is more information:
$ sudo smartctl -a /dev/sda
smartctl version 5.38 [i686-pc-linux-gnu] Copyright (C) 2002-8 Bruce Allen
Home page is http://
=== START OF INFORMATION SECTION ===
Model Family: Fujitsu MHW2 BH
Device Model: FUJITSU MHW2160BH
Serial Number: K10BT77279AT
Firmware Version: 0085001C
User Capacity: 160,041,885,696 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 3b
Local Time is: Fri Sep 26 20:18:26 2008 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 649) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 92) minutes.
Conveyance self-test routine
recommended polling time: ( 2) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 100 046 Pre-fail Always - 184633
2 Throughput_
3 Spin_Up_Time 0x0003 100 100 025 Pre-fail Always - 1
4 Start_Stop_Count 0x0032 099 099 000 Old_age Always - 754
5 Reallocated_
7 Seek_Error_Rate 0x000e 100 100 000 Old_age Always - 3515
8 Seek_Time_
9 Power_On_Hours 0x0032 093 093 000 Old_age Always - 3520
10 Spin_Retry_Count 0x0012 100 100 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 747
191 G-Sense_Error_Rate 0x0012 100 100 000 Old_age Always - 47
192 Power-Off_
194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 44 (Lifetime Min/Max 11/57)
195 Hardware_
196 Reallocated_
197 Current_
198 Offline_
199 UDMA_CRC_
200 Multi_Zone_
201 Soft_Read_
203 Run_Out_Cancel 0x0002 100 100 000 Old_age Always - 2628575231636
225 Load_Cycle_Count 0x0032 100 100 000 Old_age Always - 9844
240 Head_Flying_Hours 0x003e 200 200 000 Old_age Always - 0
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 3311 -
# 2 Short offline Completed without error 00% 1781 -
# 3 Extended offline Aborted by host 80% 431 -
# 4 Short offline Aborted by host 90% 223 -
# 5 Short offline Completed without error 00% 2 -
# 6 Short offline Completed without error 00% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
$ dmesg
[ 6629.525112] sr 0:0:0:0: [sr0] Result: hostbyte=DID_OK driverbyte=
[ 6629.525112] sr 0:0:0:0: [sr0] Sense Key : Medium Error [current]
[ 6629.525112] Info fld=0x54971
[ 6629.525112] sr 0:0:0:0: [sr0] Add. Sense: Unrecovered read error
[ 6629.525112] end_request: I/O error, dev sr0, sector 1385924
[ 6629.525112] Buffer I/O error on device sr0, logical block 346481
[ 6629.525112] Buffer I/O error on device sr0, logical block 346482
[ 6629.525112] Buffer I/O error on device sr0, logical block 346483
[ 6629.525112] Buffer I/O error on device sr0, logical block 346484
[ 6629.525112] Buffer I/O error on device sr0, logical block 346485
[ 6629.525112] Buffer I/O error on device sr0, logical block 346486
[ 6629.525112] Buffer I/O error on device sr0, logical block 346487
[ 6629.525112] Buffer I/O error on device sr0, logical block 346488
[ 6629.525112] Buffer I/O error on device sr0, logical block 346489
[ 6629.525112] Buffer I/O error on device sr0, logical block 346490
[ 6634.008557] sr 0:0:0:0: [sr0] Result: hostbyte=DID_OK driverbyte=
[ 6634.008557] sr 0:0:0:0: [sr0] Sense Key : Medium Error [current]
[ 6634.008557] Info fld=0x549e1
[ 6634.008557] sr 0:0:0:0: [sr0] Add. Sense: Unrecovered read error
[ 6634.008557] end_request: I/O error, dev sr0, sector 1386372
Any help please?
Question information
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- Solved by:
- Munzir Taha (منذر طه)
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